Electronic characteristics of InAs self-assembled quantum dots
Wang HL ; Feng SL ; Zhu HJ ; Ning D ; Chen F
刊名physica e-low-dimensional systems & nanostructures
2000
卷号7期号:3-4页码:383-387
关键词InAs/GaAs quantum dots self-assembled structure DLTS PL band offset ENERGY-LEVELS CARRIER RELAXATION SPECTROSCOPY
ISSN号1386-9477
通讯作者wang hl,qufu normal univ,dept phys,qufu 273165,peoples r china.
中文摘要deep-level transient spectroscopy and photoluminescence studies have been carried out on structures containing self-assembled inas quantum dots formed in gaas matrices. the use of n- and p-type gaas matrices allows us to study separately electron and hole levels in the quantum dots by the deep-level transient spectroscopy technique. from analysis of deep-level transient spectroscopy measurements it follows that the quantum dots have electron levels 130 mev below the bottom of the gaas conduction band and heavy-hole levels at 90 mev above the top of the gaas valence band. combining with the photoluminescence results, the band structures of inas and gaas have been determined. (c) 2000 elsevier science b.v. all rights reserved.
学科主题半导体物理
收录类别SCI
语种英语
公开日期2010-08-12
内容类型期刊论文
源URL[http://ir.semi.ac.cn/handle/172111/12558]  
专题半导体研究所_中国科学院半导体研究所(2009年前)
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Wang HL,Feng SL,Zhu HJ,et al. Electronic characteristics of InAs self-assembled quantum dots[J]. physica e-low-dimensional systems & nanostructures,2000,7(3-4):383-387.
APA Wang HL,Feng SL,Zhu HJ,Ning D,&Chen F.(2000).Electronic characteristics of InAs self-assembled quantum dots.physica e-low-dimensional systems & nanostructures,7(3-4),383-387.
MLA Wang HL,et al."Electronic characteristics of InAs self-assembled quantum dots".physica e-low-dimensional systems & nanostructures 7.3-4(2000):383-387.
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