Radiative recombination characteristics in GaAs multilayer n(+)-i interfaces
Shen WZ ; Jiang LF ; Yu G ; Lai ZY ; Wang XG ; Shen SC ; Cao X
刊名journal of applied physics
2001
卷号90期号:10页码:5444-5446
关键词FAR-INFRARED DETECTORS SI-DOPED GAAS PHOTOLUMINESCENCE LAYERS
ISSN号0021-8979
通讯作者shen wz,shanghai jiao tong univ,dept phys,lab condensed matter spect & optoelect phys,1954 hua shan rd,shanghai 200030,peoples r china.
中文摘要in this communication, we have carried out a detailed investigation of radiative recombination in n-gaas homojunction far-infrared detector structures with multilayer emitter (n(+))-intrinsic (i) interfaces by temperature-dependent steady-state photoluminescence measurements. the observation of the emitter-layer luminescence structures has been identified from their luminescence characteristics, in combination with high density theoretical calculation. a photogenerated carrier transferring model has been proposed, which can well explain the dependencies of the luminescence intensities on the laser excitation intensity and temperature. furthermore, the obtained radiative recombination behavior helps us to offer a proposal to improve the operating temperature of the detector. (c) 2001 american institute of physics.
学科主题半导体物理
收录类别SCI
语种英语
公开日期2010-08-12
内容类型期刊论文
源URL[http://ir.semi.ac.cn/handle/172111/12050]  
专题半导体研究所_中国科学院半导体研究所(2009年前)
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Shen WZ,Jiang LF,Yu G,et al. Radiative recombination characteristics in GaAs multilayer n(+)-i interfaces[J]. journal of applied physics,2001,90(10):5444-5446.
APA Shen WZ.,Jiang LF.,Yu G.,Lai ZY.,Wang XG.,...&Cao X.(2001).Radiative recombination characteristics in GaAs multilayer n(+)-i interfaces.journal of applied physics,90(10),5444-5446.
MLA Shen WZ,et al."Radiative recombination characteristics in GaAs multilayer n(+)-i interfaces".journal of applied physics 90.10(2001):5444-5446.
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