Influences of initial nitridation process on the optical and structural characterization of GaN layer grown on sapphire (0001) by metalorganic chemical vapor deposition
Sun XL ; Yang H ; Zhu JJ ; Wang YT ; Chen Y ; Li GH ; Wang ZG
刊名physica status solidi a-applied research
2001
卷号188期号:2页码:653-657
关键词GALLIUM NITRIDE LUMINESCENCE BULK
ISSN号0031-8965
通讯作者sun xl,ohio state univ,dept elect engn,columbus,oh 43210 usa.
中文摘要in this paper. we investigate the influences of the initial nitridation of sapphire substrates on the optical and structural characterizations in gan films. two gan samples with and without 3 min nitridation process were investigated by photoluminescence (pl) spectroscopy in the temperature range of 12-300 k and double-crystal x-ray diffraction (xrd). in the 12 k pl spectra of the gan sample without nitridation, four dominant peaks at 3.476, 3.409 3.362 and 3.308 ev were observed, which were assigned to donor bound exciton, excitons bound to stacking faults and extended structural defects. in the sample with nitridation, three peaks at 3.453, 3.365. and 3.308 ev were observed at 12 k, no peak related to stacking faults. xrd results at different reflections showed that there are more stacking faults in the samples without nitridation.
学科主题半导体材料
收录类别SCI
语种英语
公开日期2010-08-12
内容类型期刊论文
源URL[http://ir.semi.ac.cn/handle/172111/12020]  
专题半导体研究所_中国科学院半导体研究所(2009年前)
推荐引用方式
GB/T 7714
Sun XL,Yang H,Zhu JJ,et al. Influences of initial nitridation process on the optical and structural characterization of GaN layer grown on sapphire (0001) by metalorganic chemical vapor deposition[J]. physica status solidi a-applied research,2001,188(2):653-657.
APA Sun XL.,Yang H.,Zhu JJ.,Wang YT.,Chen Y.,...&Wang ZG.(2001).Influences of initial nitridation process on the optical and structural characterization of GaN layer grown on sapphire (0001) by metalorganic chemical vapor deposition.physica status solidi a-applied research,188(2),653-657.
MLA Sun XL,et al."Influences of initial nitridation process on the optical and structural characterization of GaN layer grown on sapphire (0001) by metalorganic chemical vapor deposition".physica status solidi a-applied research 188.2(2001):653-657.
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