Measurement of gain spectrum for Fabry-Perot semiconductor lasers by the Fourier transform method with a deconvolution process | |
Yu LJ | |
刊名 | ieee journal of quantum electronics |
2003 | |
卷号 | 39期号:6页码:716-721 |
关键词 | Fourier transform method gain measurement optical spectrum analyzer (OSA) semiconductor laser EMISSION-SPECTRA DIODES |
ISSN号 | 0018-9197 |
通讯作者 | guo wh,chinese acad sci,inst semicond,state key lab integrated optoelect,beijing 100083,peoples r china. |
中文摘要 | to improve the accuracy of measured gain spectra, which is usually limited by the resolution of the optical spectrum analyzer (osa), a deconvolution process based on the measured spectrum of a narrow linewidth semiconductor laser is applied in the fourier transform method. the numerical simulation shows that practical gain spectra can be resumed by the fourier transform method with the deconvolution process. taking the osa resolution to be 0.06, 0.1, and 0.2 nm, the gain-reflectivity product spectra with the difference of about 2% are obtained for a 1550-nm semiconductor laser with the cavity length of 720 pm. the spectra obtained by the fourier transform method without the deconvolution process and the hakki-paoli method are presented and compared. the simulation also shows that the fourier transform method has less sensitivity to noise than the hakki-paoli method. |
学科主题 | 半导体物理 |
收录类别 | SCI |
语种 | 英语 |
公开日期 | 2010-08-12 |
内容类型 | 期刊论文 |
源URL | [http://ir.semi.ac.cn/handle/172111/11558] |
专题 | 半导体研究所_中国科学院半导体研究所(2009年前) |
推荐引用方式 GB/T 7714 | Yu LJ. Measurement of gain spectrum for Fabry-Perot semiconductor lasers by the Fourier transform method with a deconvolution process[J]. ieee journal of quantum electronics,2003,39(6):716-721. |
APA | Yu LJ.(2003).Measurement of gain spectrum for Fabry-Perot semiconductor lasers by the Fourier transform method with a deconvolution process.ieee journal of quantum electronics,39(6),716-721. |
MLA | Yu LJ."Measurement of gain spectrum for Fabry-Perot semiconductor lasers by the Fourier transform method with a deconvolution process".ieee journal of quantum electronics 39.6(2003):716-721. |
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