A complex Fourier transformation study of the contactless electroreflectance of an undoped-n(+) GaAs structure
Jin P
刊名semiconductor science and technology
2006
卷号21期号:6页码:786-789
关键词DELTA-DOPED GAAS FRANZ-KELDYSH OSCILLATIONS BUILT-IN FIELD FERMI-LEVEL PHOTOREFLECTANCE SURFACE SPECTROSCOPY
ISSN号0268-1242
通讯作者jin, p, nankai univ, dept phys, tianjin 300071, peoples r china. e-mail: pengjin@red.semi.ac.cn
中文摘要complex fourier transformation (cft) has been employed to analyse contactless electroreflectance (cer) spectra from an undoped-n(+) gaas structure with various ac modulations and dc bias voltages. the cft spectra of cer have been compared with those of photoreflectance (pr). it has been found that the cer non-flat modulation is between the built-in electric field and a larger electric field which increases with the modulation voltage. the result has been explained by the screening of the applied modulation electric field in one of the two half modulation cycles and the trapping of electrons in surface states in the other half modulation cycle. the dc bias does not change the cer spectra, hence their cft spectra. this is because of the screening of the applied dc bias electric field.
学科主题半导体材料
收录类别SCI
语种英语
公开日期2010-04-11
内容类型期刊论文
源URL[http://ir.semi.ac.cn/handle/172111/10576]  
专题半导体研究所_中国科学院半导体研究所(2009年前)
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Jin P. A complex Fourier transformation study of the contactless electroreflectance of an undoped-n(+) GaAs structure[J]. semiconductor science and technology,2006,21(6):786-789.
APA Jin P.(2006).A complex Fourier transformation study of the contactless electroreflectance of an undoped-n(+) GaAs structure.semiconductor science and technology,21(6),786-789.
MLA Jin P."A complex Fourier transformation study of the contactless electroreflectance of an undoped-n(+) GaAs structure".semiconductor science and technology 21.6(2006):786-789.
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