A comparison between contactless electroreflectance and photoreflectance spectra from n-doped GaAs on a semi-insulating GaAs substrate
Jin P (Jin Peng) ; Pan SH (Pan S. H.) ; Li YG (Li Y. G.) ; Zhang CZ (Zhang C. Z.) ; Wang ZG (Wang Z. G.)
刊名semiconductor science and technology
2006
卷号21期号:10页码:1467-1471
关键词FRANZ-KELDYSH OSCILLATIONS DIFFERENTIAL PHOTOREFLECTANCE MODULATION SPECTROSCOPY FOURIER TRANSFORMATION INTERFACES SURFACE
ISSN号0268-1242
通讯作者jin, p, chinese acad sci, key lab semicond mat sci, inst semicond, pob 912, beijing 100083, peoples r china. e-mail: pengjin@red.semi.ac.cn
中文摘要contactless electroreflectance (cer) and photoreflectance (pr) measurements have been performed on samples with the structure of an n-doped gaas epitaxial layer on a semi- insulating gaas substrate. modulated reflectance signals from the n-gaas surface and those from the n-gaas/si-gaas interface are superposed in pr spectra. for the case of cer measurement, however, franz-keldysh oscillations (fkos) from the interface, which are observed in pr spectra, cannot be detected. this discrepancy is attributed to different modulation mechanisms of cer and pr. in cer experiments, the electric field modulation cannot be added to the interfacial electric field because of the effective screening by the fast response of carriers across the interface. fkos from the interface without any perturbation by the surface signals are extracted by subtracting cer spectra from pr spectra.
学科主题半导体材料
收录类别SCI
语种英语
公开日期2010-04-11
内容类型期刊论文
源URL[http://ir.semi.ac.cn/handle/172111/10234]  
专题半导体研究所_中国科学院半导体研究所(2009年前)
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GB/T 7714
Jin P ,Pan SH ,Li YG ,et al. A comparison between contactless electroreflectance and photoreflectance spectra from n-doped GaAs on a semi-insulating GaAs substrate[J]. semiconductor science and technology,2006,21(10):1467-1471.
APA Jin P ,Pan SH ,Li YG ,Zhang CZ ,&Wang ZG .(2006).A comparison between contactless electroreflectance and photoreflectance spectra from n-doped GaAs on a semi-insulating GaAs substrate.semiconductor science and technology,21(10),1467-1471.
MLA Jin P ,et al."A comparison between contactless electroreflectance and photoreflectance spectra from n-doped GaAs on a semi-insulating GaAs substrate".semiconductor science and technology 21.10(2006):1467-1471.
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