Quantum mechanical effects in nanometer field effect transistors
Luo, JW (Luo, Jun-Wei) ; Li, SS (Li, Shu-Shen) ; Xia, JB (Xia, Jian-Bai) ; Wang, LW (Wang, Lin-Wang)
刊名applied physics letters
2007
卷号90期号:14页码:art.no.143108
关键词PARTICLE POINT
ISSN号issn: 0003-6951
通讯作者luo, jw, chinese acad sci, inst semicond, state key lab superlattices & microstruct, pob 912, beijing 100083, peoples r china. 电子邮箱地址: lwwang@lbl.gov
中文摘要the atomistic pseudopotential quantum mechanical calculations for million atom nanosized metal-oxide-semiconductor field-effect transistors (mosfets) are presented. when compared with semiclassical thomas-fermi simulation results, there are significant differences in i-v curve, electron threshold voltage, and gate capacitance. in many aspects, the quantum mechanical effects exacerbate the problems encountered during device minimization, and it also presents different mechanisms in controlling the behaviors of a nanometer device than the classical one. (c) 2007 american institute of physics.
学科主题半导体物理
收录类别SCI
语种英语
公开日期2010-03-29
内容类型期刊论文
源URL[http://ir.semi.ac.cn/handle/172111/9548]  
专题半导体研究所_中国科学院半导体研究所(2009年前)
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GB/T 7714
Luo, JW ,Li, SS ,Xia, JB ,et al. Quantum mechanical effects in nanometer field effect transistors[J]. applied physics letters,2007,90(14):art.no.143108.
APA Luo, JW ,Li, SS ,Xia, JB ,&Wang, LW .(2007).Quantum mechanical effects in nanometer field effect transistors.applied physics letters,90(14),art.no.143108.
MLA Luo, JW ,et al."Quantum mechanical effects in nanometer field effect transistors".applied physics letters 90.14(2007):art.no.143108.
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