Effects of growth temperature of AlGaN buffer layer on the properties of A1(0.58)Ga(0.42)N epilayer by NH3-MBE | |
Wang XY (Wang Xiaoyan) ; Wang XL (Wang Xiaoliang) ; Wang BZ (Wang Baozhu) ; Xiao HL (Xiao Hongling) ; Wang JX (Wang Junxi) ; Zeng YP (Zeng Yiping) ; Li AN (Li Antnin) | |
刊名 | physica status solidi a-applications and materials science |
2007 | |
卷号 | 204期号:10页码:3405-3409 |
关键词 | MOLECULAR-BEAM EPITAXY |
ISSN号 | issn: 0031-8965 |
通讯作者 | wang, xy, chinese acad sci, inst semicond, beijing 100083, peoples r china. |
中文摘要 | al0.58ga0.42n epilayers are grown by ammonia gas source molecular beam epitaxy (nh3-mbe) on (0001) sapphire substrate using algan buffer layer. the effects of the buffer layer growth temperature on the properties of al0.58ga0.42n epilayer are especially investigated. in-situ high-energy electron diffraction (rheed), double-crystal x-ray diffraction (dcxrd), atomic force microscopy (afm), photoconductivity measurement and cathodoluminescence (cl) are used to characterize the samples. it is found that high growth temperature of algan buffer layer would improve the crystalline quality, surface smoothness, optical quality and uniformity of the al0.58ga0.42n epilayer. the likely reason for such improvements is also suggested. (c) 2007 wiley-vch verlag gmbh & co. kgaa, weinheim |
学科主题 | 半导体材料 |
收录类别 | SCI |
语种 | 英语 |
公开日期 | 2010-03-29 |
内容类型 | 期刊论文 |
源URL | [http://ir.semi.ac.cn/handle/172111/9218] |
专题 | 半导体研究所_中国科学院半导体研究所(2009年前) |
推荐引用方式 GB/T 7714 | Wang XY ,Wang XL ,Wang BZ ,et al. Effects of growth temperature of AlGaN buffer layer on the properties of A1(0.58)Ga(0.42)N epilayer by NH3-MBE[J]. physica status solidi a-applications and materials science,2007,204(10):3405-3409. |
APA | Wang XY .,Wang XL .,Wang BZ .,Xiao HL .,Wang JX .,...&Li AN .(2007).Effects of growth temperature of AlGaN buffer layer on the properties of A1(0.58)Ga(0.42)N epilayer by NH3-MBE.physica status solidi a-applications and materials science,204(10),3405-3409. |
MLA | Wang XY ,et al."Effects of growth temperature of AlGaN buffer layer on the properties of A1(0.58)Ga(0.42)N epilayer by NH3-MBE".physica status solidi a-applications and materials science 204.10(2007):3405-3409. |
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