Methods for characterization of packaging parasitics of semiconductor lasers

CORC > 半导体研究所 > 中国科学院半导体研究所 > 中国科学院半导体研究所（2009年前）

	Methods for characterization of packaging parasitics of semiconductor lasers
	Zhang SJ ; Zhu NH ; Liu J ; Zhang JB ; Xie L
刊名	microwave and optical technology letters
	2005
卷号	47 期号:2 页码:171-173
关键词	semiconductor lasers
ISSN号	0895-2477
通讯作者	zhang, sj, chinese acad sci, inst semicond, state key lab integrated optoelect, beijing 100083, peoples r china.
中文摘要	two novel methods for analyzing the parasitics of packaging networks are proposed based on the relations between the scattering parameters of a semiconductor laser before and after packaging, and the experiments are designed and performed using our methods. it is found that the analysis results of the two methods are in good agreement with the measurements. either of the two methods can provide an alternative approach for characterizing the packaging parasitics for semiconductor lasers, and both are convenient due to the developed measurement techniques. (c) 2005 wiley periodicals, inc.
学科主题	光电子学
收录类别	SCI
语种	英语
公开日期	2010-03-17
内容类型	期刊论文
源URL	[http://ir.semi.ac.cn/handle/172111/8518]
专题	半导体研究所_中国科学院半导体研究所（2009年前）
推荐引用方式 GB/T 7714	Zhang SJ,Zhu NH,Liu J,et al. Methods for characterization of packaging parasitics of semiconductor lasers[J]. microwave and optical technology letters,2005,47(2):171-173.
APA	Zhang SJ,Zhu NH,Liu J,Zhang JB,&Xie L.(2005).Methods for characterization of packaging parasitics of semiconductor lasers.microwave and optical technology letters,47(2),171-173.
MLA	Zhang SJ,et al."Methods for characterization of packaging parasitics of semiconductor lasers".microwave and optical technology letters 47.2(2005):171-173.