Dependence of implantation-induced damage with photoluminescence intensity in GaN : Er
Song, SF ; Chen, WD ; Zhu, JJ ; Hsu, CC
刊名journal of crystal growth
2004
卷号265期号:1-2页码:78-82
关键词defects
ISSN号0022-0248
通讯作者song, sf, chinese acad sci, inst semicond, po 912, beijing 100083, peoples r china. 电子邮箱地址: sfsong@red.semi.ac.cn
中文摘要erbium was implanted with energies 200 or 400 kev into epitaxial (0 0 0 1) gan grown on (0 0 0 1) al2o3 substrate at room temperature (rt) and 400degreesc. both random (10degrees tilt from c-axis) and channeled (along c-axis) implantations were studied. rbs/channeling technique was used to study the dependences of the radiation damage with ion implantation energy, direction and temperature. it was found that the channeling implantation or elevating temperature implantation both resulted in the decrease of the damage. moreover, the photoluminscence (pl) properties of er-implanted gan thin filius were also studied. the experimental results indicate that the pl intensity can be enhanced by raising implantation energy or implanting along channeling direction. (c) 2004 elsevier b.v. all rights reserved.
学科主题光电子学
收录类别SCI
语种英语
公开日期2010-03-09
内容类型期刊论文
源URL[http://ir.semi.ac.cn/handle/172111/8110]  
专题半导体研究所_中国科学院半导体研究所(2009年前)
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Song, SF,Chen, WD,Zhu, JJ,et al. Dependence of implantation-induced damage with photoluminescence intensity in GaN : Er[J]. journal of crystal growth,2004,265(1-2):78-82.
APA Song, SF,Chen, WD,Zhu, JJ,&Hsu, CC.(2004).Dependence of implantation-induced damage with photoluminescence intensity in GaN : Er.journal of crystal growth,265(1-2),78-82.
MLA Song, SF,et al."Dependence of implantation-induced damage with photoluminescence intensity in GaN : Er".journal of crystal growth 265.1-2(2004):78-82.
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