| Investigation of oxide layer on CdTe film surface and its effect on the device performance | |
| Han, JF; Xiao, L; Cha, LM; Hamon, J; Besland, MP | |
| 刊名 | Materials Science in Semiconductor Processing
 |
| 2015 | |
| 卷号 | Vol.40页码:402-406 |
| 关键词 | CdTe solar cell Surface oxidation Thin film XPS |
| ISSN号 | 1369-8001 |
| URL标识 | 查看原文 |
| 公开日期 | [db:dc_date_available] |
| 内容类型 | 期刊论文 |
| URI标识 | http://www.corc.org.cn/handle/1471x/6089581 |
| 专题 | 湖南大学 |
| 作者单位 | 1.Beijing Inst Technol, Sch Phys, Beijing 100081, Peoples R China 2.Hunan Univ, Coll Mat Sci & Engn, Changsha 410082, Hunan, Peoples R China 3.Univ Nantes, Inst Mat Jean Rouxel IMN, UMR CNRS 6502, F-44322 Nantes, France |
| 推荐引用方式 GB/T 7714 | Han, JF,Xiao, L,Cha, LM,et al. Investigation of oxide layer on CdTe film surface and its effect on the device performance[J]. Materials Science in Semiconductor Processing,2015,Vol.40:402-406. |
| APA | Han, JF,Xiao, L,Cha, LM,Hamon, J,&Besland, MP.(2015).Investigation of oxide layer on CdTe film surface and its effect on the device performance.Materials Science in Semiconductor Processing,Vol.40,402-406. |
| MLA | Han, JF,et al."Investigation of oxide layer on CdTe film surface and its effect on the device performance".Materials Science in Semiconductor Processing Vol.40(2015):402-406. |
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