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	The research on statistical properties of TDI-CCD imaging noise (EI CONFERENCE)
	Gu Y.-Y. ; Shen X.-H. ; He G.-X.
	2011
会议名称	International Symposium on Photoelectronic Detection and Imaging 2011: Advances in Imaging Detectors and Applications, May 24, 2011 - May 26, 2011
会议地点	Beijing, China
关键词	TDI-CCD can improve the sensitivity of space camera without any degradation of spatial resolution which is widely used in aerospace imaging devices. The article describes the basic working principle and application characteristics of TDI-CCD devices analyses the composition of TDI-CCD imaging noise and propose a new method to analyze TDI-CCD imaging noise with statistical probability distribution. In order to estimate the distribution of gray values affect by noise we introduced the concept of skewness and kurtosis. We design an experiment using constant illumination light source take image with TDI-CCD working at different stage such as stage 16 stage 32 stage 48 stage 64 and stage 96 analyse the characteristics of image noise with the method we proposed experimental results show that the gray values approximately meet normal distribution in large sample cases. 2011 SPIE.
收录类别	EI
内容类型	会议论文
源URL	[http://ir.ciomp.ac.cn/handle/181722/33739]
专题	长春光学精密机械与物理研究所_中科院长春光机所知识产出_会议论文
推荐引用方式 GB/T 7714	Gu Y.-Y.,Shen X.-H.,He G.-X.. The research on statistical properties of TDI-CCD imaging noise (EI CONFERENCE)[C]. 见:International Symposium on Photoelectronic Detection and Imaging 2011: Advances in Imaging Detectors and Applications, May 24, 2011 - May 26, 2011. Beijing, China.

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