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	System identification of tracking error and evaluation of tracking performance using BP neural network (EI CONFERENCE)
	Zhang N. ; Shen X.-H.
	2009
会议名称	International Symposium on Photoelectronic Detection and Imaging 2009: Advances in Infrared Imaging and Applications, June 17, 2009 - June 19, 2009
会议地点	Beijing, China
关键词	A novel approach for evaluating the tracking performance of optoelectronic theodolite is proposed. First an equivalent mathematic model of tracking error is established. Then the equivalent sine signal is inputted to the equivalent model and the outputs are sampled. The results of evaluating the tracking performance are obtained based on the statistical calculation of output produced by equivalent model. Equivalent model using the BP (Backprogration) neural network structure is identified. The training method of BP neural network adopts the LM (Levenberg-Marquardt) algorithm for the sake of speeding up training process. The BP neural network is trained and tested by using the training and testing samples gotten from the simulation model of optoelectronic theodolite tracking system under MATLAB/SIMULINK. The estimate errors of equivalent model including average error maximum error and standard error are 2.5872e-0060 2.8 and 1.9. The results show that the equivalent model identified based on BP neural network meets the needs of evaluating the tracking performance of optoelectronic theodolite. The accurate evaluation of tracking performance is achieved. 2009 SPIE.
收录类别	EI
内容类型	会议论文
源URL	[http://ir.ciomp.ac.cn/handle/181722/33728]
专题	长春光学精密机械与物理研究所_中科院长春光机所知识产出_会议论文
推荐引用方式 GB/T 7714	Zhang N.,Shen X.-H.. System identification of tracking error and evaluation of tracking performance using BP neural network (EI CONFERENCE)[C]. 见:International Symposium on Photoelectronic Detection and Imaging 2009: Advances in Infrared Imaging and Applications, June 17, 2009 - June 19, 2009. Beijing, China.

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