Appropriate sampling quantity and its influence on particle sizing results in PCS technique | |
Shen, Jin; Cheng, Yanting; Liu, Wei; Wang, Yajing | |
2009 | |
会议名称 | 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment |
会议日期 | November 19, 2008 - November 21, 2008 |
卷号 | 7283 |
DOI | 10.1117/12.828767 |
收录类别 | EI |
会议录 | Proceedings of SPIE - The International Society for Optical Engineering |
URL标识 | 查看原文 |
内容类型 | 会议论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/6066953 |
专题 | 山东大学 |
作者单位 | School of Electrical and Electronic Engineering, Shandong University of Technology, China, Zhangz |
推荐引用方式 GB/T 7714 | Shen, Jin,Cheng, Yanting,Liu, Wei,et al. Appropriate sampling quantity and its influence on particle sizing results in PCS technique[C]. 见:4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment. November 19, 2008 - November 21, 2008. |
个性服务 |
查看访问统计 |
相关权益政策 |
暂无数据 |
收藏/分享 |
除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。
修改评论