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Appropriate sampling quantity and its influence on particle sizing results in PCS technique
Shen, Jin; Cheng, Yanting; Liu, Wei; Wang, Yajing
2009
会议名称4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
会议日期November 19, 2008 - November 21, 2008
卷号7283
DOI10.1117/12.828767
收录类别EI
会议录Proceedings of SPIE - The International Society for Optical Engineering
URL标识查看原文
内容类型会议论文
URI标识http://www.corc.org.cn/handle/1471x/6066953
专题山东大学
作者单位School of Electrical and Electronic Engineering, Shandong University of Technology, China, Zhangz
推荐引用方式
GB/T 7714
Shen, Jin,Cheng, Yanting,Liu, Wei,et al. Appropriate sampling quantity and its influence on particle sizing results in PCS technique[C]. 见:4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment. November 19, 2008 - November 21, 2008.
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