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	Key technology design of virtual instrument for fault detection on analogue integrated operation-amplifier based on FPGA and DSP
	Bao, Bengang; Zhu, Xiangping; Tan, Yonghong; Chen, Hongwei
刊名	International Journal of Mechatronics and Applied Mechanics
	2017
卷号	Vol.2017 No.2页码:87-92
ISSN号	2559-6497;2559-4397
URL标识	查看原文
公开日期	[db:dc_date_available]
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/6049869
专题	湖南大学
作者单位	1.Department of Physics and Electrical Engineering, Hunan University of Science and Engineering, Yongzhou 2.425199, China
推荐引用方式 GB/T 7714	Bao, Bengang,Zhu, Xiangping,Tan, Yonghong,et al. Key technology design of virtual instrument for fault detection on analogue integrated operation-amplifier based on FPGA and DSP[J]. International Journal of Mechatronics and Applied Mechanics,2017,Vol.2017 No.2:87-92.
APA	Bao, Bengang,Zhu, Xiangping,Tan, Yonghong,&Chen, Hongwei.(2017).Key technology design of virtual instrument for fault detection on analogue integrated operation-amplifier based on FPGA and DSP.International Journal of Mechatronics and Applied Mechanics,Vol.2017 No.2,87-92.
MLA	Bao, Bengang,et al."Key technology design of virtual instrument for fault detection on analogue integrated operation-amplifier based on FPGA and DSP".International Journal of Mechatronics and Applied Mechanics Vol.2017 No.2(2017):87-92.

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