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	Active disturbance rejection control design for fast AFM
	Chen, D.; Yin, B.; Liu, J.; Li, W.; Wu, L.; Li, H.
刊名	Key Engineering Materials
	2015
卷号	645页码:670-674
关键词	Atomic force microscopy Discrete time control systems Three term control systems Traction control Nanotechnology Active disturbance rejection control design Active disturbance rejection controls Contact modes Control problems External disturbances Fast scan Process parameter variations System vibrations Disturbance rejection
ISSN号	10139826
DOI	10.4028/www.scientific.net/KEM.645-646.670
URL标识	查看原文
收录类别	EI
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/5961330
专题	北京航空航天大学
推荐引用方式 GB/T 7714	Chen, D.,Yin, B.,Liu, J.,et al. Active disturbance rejection control design for fast AFM[J]. Key Engineering Materials,2015,645:670-674.
APA	Chen, D.,Yin, B.,Liu, J.,Li, W.,Wu, L.,&Li, H..(2015).Active disturbance rejection control design for fast AFM.Key Engineering Materials,645,670-674.
MLA	Chen, D.,et al."Active disturbance rejection control design for fast AFM".Key Engineering Materials 645(2015):670-674.

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