Fracture analysis of surface exfoliation on single crystal silicon irradiated by intense pulsed ion beam | |
Shen, Jie; Shahid, Ijaz; Yu, Xiao; Zhang, Jie; Zhong, Haowen; Cui, Xiaojun; Liang, Guoying; Yu, Xiang; Huang, Wanying; Yan, Sha | |
刊名 | NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
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2017 | |
卷号 | 413页码:6-12 |
关键词 | Intense pulsed ion beam Single crystal silicon Finite element method Exfoliation J integral |
ISSN号 | 0168-583X |
DOI | 10.1016/j.nimb.2017.09.031 |
URL标识 | 查看原文 |
收录类别 | SCIE |
WOS记录号 | WOS:000417774800002 |
内容类型 | 期刊论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/5946793 |
专题 | 北京航空航天大学 |
推荐引用方式 GB/T 7714 | Shen, Jie,Shahid, Ijaz,Yu, Xiao,et al. Fracture analysis of surface exfoliation on single crystal silicon irradiated by intense pulsed ion beam[J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS,2017,413:6-12. |
APA | Shen, Jie.,Shahid, Ijaz.,Yu, Xiao.,Zhang, Jie.,Zhong, Haowen.,...&Le, Xiaoyun.(2017).Fracture analysis of surface exfoliation on single crystal silicon irradiated by intense pulsed ion beam.NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS,413,6-12. |
MLA | Shen, Jie,et al."Fracture analysis of surface exfoliation on single crystal silicon irradiated by intense pulsed ion beam".NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS 413(2017):6-12. |
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