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Fracture analysis of surface exfoliation on single crystal silicon irradiated by intense pulsed ion beam
Shen, Jie; Shahid, Ijaz; Yu, Xiao; Zhang, Jie; Zhong, Haowen; Cui, Xiaojun; Liang, Guoying; Yu, Xiang; Huang, Wanying; Yan, Sha
刊名NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
2017
卷号413页码:6-12
关键词Intense pulsed ion beam Single crystal silicon Finite element method Exfoliation J integral
ISSN号0168-583X
DOI10.1016/j.nimb.2017.09.031
URL标识查看原文
收录类别SCIE
WOS记录号WOS:000417774800002
内容类型期刊论文
URI标识http://www.corc.org.cn/handle/1471x/5946793
专题北京航空航天大学
推荐引用方式
GB/T 7714
Shen, Jie,Shahid, Ijaz,Yu, Xiao,et al. Fracture analysis of surface exfoliation on single crystal silicon irradiated by intense pulsed ion beam[J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS,2017,413:6-12.
APA Shen, Jie.,Shahid, Ijaz.,Yu, Xiao.,Zhang, Jie.,Zhong, Haowen.,...&Le, Xiaoyun.(2017).Fracture analysis of surface exfoliation on single crystal silicon irradiated by intense pulsed ion beam.NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS,413,6-12.
MLA Shen, Jie,et al."Fracture analysis of surface exfoliation on single crystal silicon irradiated by intense pulsed ion beam".NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS 413(2017):6-12.
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