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Resonant Mode Engineering of Photonic Crystal Sensors Clad with Ultralow Refractive Index Porous Silicon Dioxide
Wan, Yuhang; Krueger, Neil A.; Ocier, Christian R.; Su, Patrick; Braun, Paul V.; Cunningham, Brian T.
刊名ADVANCED OPTICAL MATERIALS
2017
卷号5
关键词optical sensors photonic crystals porous silicon
ISSN号2195-1071
DOI10.1002/adom.201700605
URL标识查看原文
收录类别SCIE ; EI
WOS记录号WOS:000414353100013
内容类型期刊论文
URI标识http://www.corc.org.cn/handle/1471x/5937660
专题北京航空航天大学
推荐引用方式
GB/T 7714
Wan, Yuhang,Krueger, Neil A.,Ocier, Christian R.,et al. Resonant Mode Engineering of Photonic Crystal Sensors Clad with Ultralow Refractive Index Porous Silicon Dioxide[J]. ADVANCED OPTICAL MATERIALS,2017,5.
APA Wan, Yuhang,Krueger, Neil A.,Ocier, Christian R.,Su, Patrick,Braun, Paul V.,&Cunningham, Brian T..(2017).Resonant Mode Engineering of Photonic Crystal Sensors Clad with Ultralow Refractive Index Porous Silicon Dioxide.ADVANCED OPTICAL MATERIALS,5.
MLA Wan, Yuhang,et al."Resonant Mode Engineering of Photonic Crystal Sensors Clad with Ultralow Refractive Index Porous Silicon Dioxide".ADVANCED OPTICAL MATERIALS 5(2017).
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