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	A fast and robust convolutional neural network-based defect detection model in product quality control
	Wang, Tian; Chen, Yang; Qiao, Meina; Snoussi, Hichem
刊名	INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY
	2018
卷号	94页码:3465-3471
关键词	Product quality control Defect detection Convolutional neural networks
ISSN号	0268-3768
DOI	10.1007/s00170-017-0882-0
URL标识	查看原文
收录类别	SCIE ; EI
WOS记录号	WOS:000425592900036
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/5935233
专题	北京航空航天大学
推荐引用方式 GB/T 7714	Wang, Tian,Chen, Yang,Qiao, Meina,et al. A fast and robust convolutional neural network-based defect detection model in product quality control[J]. INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY,2018,94:3465-3471.
APA	Wang, Tian,Chen, Yang,Qiao, Meina,&Snoussi, Hichem.(2018).A fast and robust convolutional neural network-based defect detection model in product quality control.INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY,94,3465-3471.
MLA	Wang, Tian,et al."A fast and robust convolutional neural network-based defect detection model in product quality control".INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY 94(2018):3465-3471.

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