| A Sequential Bayesian Approach for Remaining Useful Life Prediction of Dependent Competing Failure Processes | |
| Fan, Mengfei; Zeng, Zhiguo; Zio, Enrico; Kang, Rui; Chen, Ying | |
| 刊名 | IEEE TRANSACTIONS ON RELIABILITY
 |
| 2019 | |
| 卷号 | 68页码:317-329 |
| 关键词 | Degradation dependent competing failure processes Markov chain Monte Carlo particle filtering prognostics random shocks remaining useful life |
| ISSN号 | 0018-9529 |
| DOI | 10.1109/TR.2018.2874459 |
| URL标识 | 查看原文 |
| 收录类别 | SCIE |
| WOS记录号 | WOS:000460728600021 |
| 内容类型 | 期刊论文 |
| URI标识 | http://www.corc.org.cn/handle/1471x/5921542 |
| 专题 | 北京航空航天大学 |
| 推荐引用方式 GB/T 7714 | Fan, Mengfei,Zeng, Zhiguo,Zio, Enrico,et al. A Sequential Bayesian Approach for Remaining Useful Life Prediction of Dependent Competing Failure Processes[J]. IEEE TRANSACTIONS ON RELIABILITY,2019,68:317-329. |
| APA | Fan, Mengfei,Zeng, Zhiguo,Zio, Enrico,Kang, Rui,&Chen, Ying.(2019).A Sequential Bayesian Approach for Remaining Useful Life Prediction of Dependent Competing Failure Processes.IEEE TRANSACTIONS ON RELIABILITY,68,317-329. |
| MLA | Fan, Mengfei,et al."A Sequential Bayesian Approach for Remaining Useful Life Prediction of Dependent Competing Failure Processes".IEEE TRANSACTIONS ON RELIABILITY 68(2019):317-329. |
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