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	Degradation Modeling and Performance Monitoring of Electro-optical Detection System via Dynamic Bayesian Network
	Yu, J.S.; Shi, Y.Y.; Tang, D.Y.; Liu, H.
	2019
会议名称	IEEE International Conference on Industrial Engineering and Engineering Management
会议日期	2018-12-16
关键词	Bayesian networks Monte Carlo methods Optical transfer function Degradation model Dynamic Bayesian networks Multi-field coupling Particle Filtering Performance monitoring Knowledge based systems
卷号	2019-December
页码	1693-1698
收录类别	EI
URL标识	查看原文
内容类型	会议论文
URI标识	http://www.corc.org.cn/handle/1471x/5920958
专题	北京航空航天大学
推荐引用方式 GB/T 7714	Yu, J.S.,Shi, Y.Y.,Tang, D.Y.,et al. Degradation Modeling and Performance Monitoring of Electro-optical Detection System via Dynamic Bayesian Network[C]. 见:IEEE International Conference on Industrial Engineering and Engineering Management. 2018-12-16.

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