QQ客服 官方微博 反馈留言

	Measurement of Temperature Dependence Complex Permittivity Based on Fitting Algorithm of Terminal short circuit
	Li, Q.; Li, H.; Liu, D.; Bai, M.
	2019
会议名称	2018 International Applied Computational Electromagnetics Society Symposium in China, ACES-China 2018
会议日期	2018-07-29
关键词	Permittivity Temperature distribution Timing circuits Calculation process Complex permittivity Fitting algorithms High temperature Low loss material Measurement of temperature Temperature dependence Test systems Computational electromagnetics
收录类别	EI
URL标识	查看原文
内容类型	会议论文
URI标识	http://www.corc.org.cn/handle/1471x/5920185
专题	北京航空航天大学
推荐引用方式 GB/T 7714	Li, Q.,Li, H.,Liu, D.,et al. Measurement of Temperature Dependence Complex Permittivity Based on Fitting Algorithm of Terminal short circuit[C]. 见:2018 International Applied Computational Electromagnetics Society Symposium in China, ACES-China 2018. 2018-07-29.

个性服务

查看访问统计

相关权益政策

暂无数据

收藏/分享

除非特别说明，本系统中所有内容都受版权保护，并保留所有权利。