Investigation of Multi-Plane Scheme for Compensation of Fringe Effect of Electrical Resistance Tomography Sensor | |
Tian, Wenbin; Liang, Xiaofeng; Qu, Xiaolei; Sun, Jiangtao; Gao, Shuo; Xu, Lijun; Yang, Wuqiang | |
刊名 | SENSORS |
2019 | |
卷号 | 19 |
关键词 | electrical resistance tomography fringe effect multiple-plane ERT sensor |
ISSN号 | 1424-8220 |
DOI | 10.3390/s19143132 |
URL标识 | 查看原文 |
收录类别 | SCIE ; PUBMED |
WOS记录号 | WOS:000479160300099 |
内容类型 | 期刊论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/5918064 |
专题 | 北京航空航天大学 |
推荐引用方式 GB/T 7714 | Tian, Wenbin,Liang, Xiaofeng,Qu, Xiaolei,et al. Investigation of Multi-Plane Scheme for Compensation of Fringe Effect of Electrical Resistance Tomography Sensor[J]. SENSORS,2019,19. |
APA | Tian, Wenbin.,Liang, Xiaofeng.,Qu, Xiaolei.,Sun, Jiangtao.,Gao, Shuo.,...&Yang, Wuqiang.(2019).Investigation of Multi-Plane Scheme for Compensation of Fringe Effect of Electrical Resistance Tomography Sensor.SENSORS,19. |
MLA | Tian, Wenbin,et al."Investigation of Multi-Plane Scheme for Compensation of Fringe Effect of Electrical Resistance Tomography Sensor".SENSORS 19(2019). |
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