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Investigation of Multi-Plane Scheme for Compensation of Fringe Effect of Electrical Resistance Tomography Sensor
Tian, Wenbin; Liang, Xiaofeng; Qu, Xiaolei; Sun, Jiangtao; Gao, Shuo; Xu, Lijun; Yang, Wuqiang
刊名SENSORS
2019
卷号19
关键词electrical resistance tomography fringe effect multiple-plane ERT sensor
ISSN号1424-8220
DOI10.3390/s19143132
URL标识查看原文
收录类别SCIE ; PUBMED
WOS记录号WOS:000479160300099
内容类型期刊论文
URI标识http://www.corc.org.cn/handle/1471x/5918064
专题北京航空航天大学
推荐引用方式
GB/T 7714
Tian, Wenbin,Liang, Xiaofeng,Qu, Xiaolei,et al. Investigation of Multi-Plane Scheme for Compensation of Fringe Effect of Electrical Resistance Tomography Sensor[J]. SENSORS,2019,19.
APA Tian, Wenbin.,Liang, Xiaofeng.,Qu, Xiaolei.,Sun, Jiangtao.,Gao, Shuo.,...&Yang, Wuqiang.(2019).Investigation of Multi-Plane Scheme for Compensation of Fringe Effect of Electrical Resistance Tomography Sensor.SENSORS,19.
MLA Tian, Wenbin,et al."Investigation of Multi-Plane Scheme for Compensation of Fringe Effect of Electrical Resistance Tomography Sensor".SENSORS 19(2019).
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