Integrated circuit photomicrography system based on SEM | |
Liu, Wei; Yin, Bo-Hua | |
刊名 | Weixi Jiagong Jishu/Microfabrication Technology |
2008 | |
期号 | 3页码:1-4 |
URL标识 | 查看原文 |
内容类型 | 期刊论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/5547826 |
专题 | 山东大学 |
作者单位 | 1.College of Electrical and Electronic Engineering, Shandong University of Technology, Zibo 255049, China 2.Institute of Electrical Engineering, Chi |
推荐引用方式 GB/T 7714 | Liu, Wei,Yin, Bo-Hua. Integrated circuit photomicrography system based on SEM[J]. Weixi Jiagong Jishu/Microfabrication Technology,2008(3):1-4. |
APA | Liu, Wei,&Yin, Bo-Hua.(2008).Integrated circuit photomicrography system based on SEM.Weixi Jiagong Jishu/Microfabrication Technology(3),1-4. |
MLA | Liu, Wei,et al."Integrated circuit photomicrography system based on SEM".Weixi Jiagong Jishu/Microfabrication Technology .3(2008):1-4. |
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