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	Defect-Enhanced Charge Separation and Transfer within Protection Layer/Semiconductor Structure of Photoanodes
	Zheng, Jianyun; Lyu, Yanhong; Xie, Chao; Wang, Ruilun; Tao, Li; Wu, Haibo; Zhou, Huaijuan; Jiang, Sanping; Wang, Shuangyin
刊名	ADVANCED MATERIALS
	2018
卷号	Vol.30 No.31
关键词	charge separation and transfer doping oxygen defects plasma protection layers
ISSN号	0935-9648
URL标识	查看原文
公开日期	[db:dc_date_available]
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/5459559
专题	湖南大学
作者单位	1.State Key Laboratory of Chem/Bio-Sensing and Chemometrics, College of Chemistry and Chemical Engineering, Hunan University, Changsha 2.Hunan 3.410082, China 4.State Key Laboratory of High Performance Ceramics and Superfine Microstructure, Shanghai In
推荐引用方式 GB/T 7714	Zheng, Jianyun,Lyu, Yanhong,Xie, Chao,et al. Defect-Enhanced Charge Separation and Transfer within Protection Layer/Semiconductor Structure of Photoanodes[J]. ADVANCED MATERIALS,2018,Vol.30 No.31.
APA	Zheng, Jianyun.,Lyu, Yanhong.,Xie, Chao.,Wang, Ruilun.,Tao, Li.,...&Wang, Shuangyin.(2018).Defect-Enhanced Charge Separation and Transfer within Protection Layer/Semiconductor Structure of Photoanodes.ADVANCED MATERIALS,Vol.30 No.31.
MLA	Zheng, Jianyun,et al."Defect-Enhanced Charge Separation and Transfer within Protection Layer/Semiconductor Structure of Photoanodes".ADVANCED MATERIALS Vol.30 No.31(2018).

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