Why RTL ATPG?

	Why RTL ATPG?
	Min, YG
刊名	JOURNAL OF COMPUTER SCIENCE AND TECHNOLOGY
	2002-03-01
卷号	17 期号:2 页码:113-117
关键词	automatic test generation (ATPG) register transfer level (RTL)
ISSN号	1000-9000
英文摘要	Register Transfer Level (RTL) Automatic Test Pattern Generation (ATPG) has been of wide concern for two decades. Meanwhile gate-level ATPG has made remarkable progress in dealing with large circuits. An argument is then posed. Do we need RTL ATPG in the case of gate-level ATPG capable of generating tests for large circuits? This paper attempts to answer this question. The necessity, difficulty, and major interests of RTL ATPG are reviewed.
WOS研究方向	Computer Science
语种	英语
出版者	SCIENCE PRESS
WOS记录号	WOS:000174736600001
内容类型	期刊论文
源URL	[http://119.78.100.204/handle/2XEOYT63/13568]
专题	中国科学院计算技术研究所期刊论文_英文
通讯作者	Min, YG
作者单位	Chinese Acad Sci, Comp Technol Inst, Beijing 100080, Peoples R China
推荐引用方式 GB/T 7714	Min, YG. Why RTL ATPG?[J]. JOURNAL OF COMPUTER SCIENCE AND TECHNOLOGY,2002,17(2):113-117.
APA	Min, YG.(2002).Why RTL ATPG?.JOURNAL OF COMPUTER SCIENCE AND TECHNOLOGY,17(2),113-117.
MLA	Min, YG."Why RTL ATPG?".JOURNAL OF COMPUTER SCIENCE AND TECHNOLOGY 17.2(2002):113-117.