Fault tolerance on-chip: a reliable computing paradigm using self-test, self-diagnosis, and self-repair (3S) approach

doi:10.1007/s11432-017-9290-4

CORC > 计算技术研究所 > 中国科学院计算技术研究所 > 中国科学院计算技术研究所期刊论文 > 英文

	Fault tolerance on-chip: a reliable computing paradigm using self-test, self-diagnosis, and self-repair (3S) approach
	Li, Xiaowei 1,2; Yan, Guihai 1,2; Ye, Jing 2; Wang, Ying 2
刊名	SCIENCE CHINA-INFORMATION SCIENCES
	2018-11-01
卷号	61 期号:11 页码:17
关键词	fault tolerance on-chip self-test self-diagnosis self-repair
ISSN号	1674-733X
DOI	10.1007/s11432-017-9290-4
英文摘要	If your computer crashes, you can revive it by a reboot, an empirical solution that usually turns out to be effective. The rationale behind this solution is that transient faults, either in hardware or software, can be fixed by refreshing the machine state. Such a "silver bullet", however, could be futile in the future because the faults, especially those existing in the hardware such as Integrated Circuit (IC) chips, cannot be eliminated by refreshing. What we need is a more sophisticated mechanism to steer the system back to the right track. The "magic cure" is the Fault Tolerance On-Chip (FTOC) mechanism, which relies on a suite of built-in design-for-reliability logic, including fault detection, fault diagnosis, and error recovery, working in a self-supportive manner. We have exploited the FTOC to build a holistic solution ranging from on-chip fault detection to error recovery mechanisms to address faults caused by chips progressively aging. Besides fault detection, the FTOC paradigm provides attractive benefits, such as facilitating graceful performance degradation, mitigating the impact of verification blind spots, and improving the chip yield.
资助项目	National Natural Science Foundation of China[61532017] ; National Natural Science Foundation of China[61572470] ; National Natural Science Foundation of China[61521092] ; National Natural Science Foundation of China[61522406] ; National Natural Science Foundation of China[61432017] ; National Natural Science Foundation of China[61376043] ; Youth Innovation Promotion Association, CAS[Y404441000]
WOS研究方向	Computer Science ; Engineering
语种	英语
出版者	SCIENCE PRESS
WOS记录号	WOS:000436197800002
内容类型	期刊论文
源URL	[http://119.78.100.204/handle/2XEOYT63/5149]
专题	中国科学院计算技术研究所期刊论文_英文
通讯作者	Yan, Guihai
作者单位	1.Univ Chinese Acad Sci, Beijing 100049, Peoples R China 2.Chinese Acad Sci, Inst Comp Technol, State Key Lab Comp Architecture, Beijing 100190, Peoples R China
推荐引用方式 GB/T 7714	Li, Xiaowei,Yan, Guihai,Ye, Jing,et al. Fault tolerance on-chip: a reliable computing paradigm using self-test, self-diagnosis, and self-repair (3S) approach[J]. SCIENCE CHINA-INFORMATION SCIENCES,2018,61(11):17.
APA	Li, Xiaowei,Yan, Guihai,Ye, Jing,&Wang, Ying.(2018).Fault tolerance on-chip: a reliable computing paradigm using self-test, self-diagnosis, and self-repair (3S) approach.SCIENCE CHINA-INFORMATION SCIENCES,61(11),17.
MLA	Li, Xiaowei,et al."Fault tolerance on-chip: a reliable computing paradigm using self-test, self-diagnosis, and self-repair (3S) approach".SCIENCE CHINA-INFORMATION SCIENCES 61.11(2018):17.