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	Depairing current density through a low-angle grain boundary in a superconducting film
	Xue, Feng[1]; Zhang, Zhaoxia[2]; Zeng, Jun[3]; Gou, Xiaofan[4]
刊名	AIP ADVANCES
	2016
卷号	6期号:5
ISSN号	2158-3226
DOI	http://dx.doi.org/10.1063/1.4950798
URL标识	查看原文
收录类别	SCI(E) ; EI
WOS记录号	WOS:000377962500084
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/5373252
专题	江苏大学
作者单位	[1]Department of Engineering Mechanics, Hohai University, Nanjing, 210098, China [2]Faculty of Civil Engineering and Mechanics, Jiangsu University, Zhenjiang, 212013, China [3]College of Mechanical Engineering, Zhejiang University of Technology, Hangzhou, Zhejiang, 310014, China[4]Department of Engineering Mechanics, Hohai University, Nanjing, 210098, China
推荐引用方式 GB/T 7714	Xue, Feng[1],Zhang, Zhaoxia[2],Zeng, Jun[3],et al. Depairing current density through a low-angle grain boundary in a superconducting film[J]. AIP ADVANCES,2016,6(5).
APA	Xue, Feng[1],Zhang, Zhaoxia[2],Zeng, Jun[3],&Gou, Xiaofan[4].(2016).Depairing current density through a low-angle grain boundary in a superconducting film.AIP ADVANCES,6(5).
MLA	Xue, Feng[1],et al."Depairing current density through a low-angle grain boundary in a superconducting film".AIP ADVANCES 6.5(2016).

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