QQ客服 官方微博 反馈留言

	VCSEL-Based In-Circuit Status-Monitoring and Effects-Diagnosis Method for HPEM Susceptibility Test on Digital Electronic Equipment.
	Wang,Jianguo; Yang,Meng; Hao,Wenxi; Yan,Junkai; He,Yanyang; Tang,Chuanxiang; Liu,Xiaolong
刊名	IEEE Transactions on Electromagnetic Compatibility
	2018
卷号	Vol.60 No.1页码:234-242
关键词	ELECTRONICS INFORMATION technology ELECTRONIC apparatus & appliances INTEGRATED circuits DIGITAL electronics
ISSN号	0018-9375
URL标识	查看原文
公开日期	[db:dc_date_available]
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/5349100
专题	上海电子信息职业技术学院
作者单位	1 Department of Engineering Physics, Tsinghua University, Beijing, China 2 Northwest Institute of Nuclear Technology, Xi\'an, China 3 Northwest Institute of Nuclear Technology, Shaanxi, China 4 51st Research Institute of China Electronic Technology Corporation, Shanghai, China
推荐引用方式 GB/T 7714	Wang,Jianguo,Yang,Meng,Hao,Wenxi,et al. VCSEL-Based In-Circuit Status-Monitoring and Effects-Diagnosis Method for HPEM Susceptibility Test on Digital Electronic Equipment.[J]. IEEE Transactions on Electromagnetic Compatibility,2018,Vol.60 No.1:234-242.
APA	Wang,Jianguo.,Yang,Meng.,Hao,Wenxi.,Yan,Junkai.,He,Yanyang.,...&Liu,Xiaolong.(2018).VCSEL-Based In-Circuit Status-Monitoring and Effects-Diagnosis Method for HPEM Susceptibility Test on Digital Electronic Equipment..IEEE Transactions on Electromagnetic Compatibility,Vol.60 No.1,234-242.
MLA	Wang,Jianguo,et al."VCSEL-Based In-Circuit Status-Monitoring and Effects-Diagnosis Method for HPEM Susceptibility Test on Digital Electronic Equipment.".IEEE Transactions on Electromagnetic Compatibility Vol.60 No.1(2018):234-242.

个性服务

查看访问统计

相关权益政策

暂无数据

收藏/分享

除非特别说明，本系统中所有内容都受版权保护，并保留所有权利。