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	Code churn: A neglected metric in effort-aware just-in-time defect prediction
	Liu, Jinping[1]; Zhou, Yuming[2]; Yang, Yibiao[3]; Lu, Hongmin[4]; Xu, Baowen[5]
	2017
会议名称	11TH ACM/IEEE INTERNATIONAL SYMPOSIUM ON EMPIRICAL SOFTWARE ENGINEERING AND MEASUREMENT (ESEM 2017)
会议日期	2017-01-01
关键词	Defect prediction changes just-in-time code churn unsupervised models supervised models
页码	11-19
收录类别	EI ; CPCI-S
URL标识	查看原文
WOS记录号	WOS:000425929000002
内容类型	会议论文
URI标识	http://www.corc.org.cn/handle/1471x/5342791
专题	江苏大学
作者单位	1.[1]Nanjing Univ, State Key Lab Novel Software Technol, Nanjing, Jiangsu, Peoples R China. 2.Jiangsu Univ, Sch Comp Sci & Telecommun Engn, Zhenjiang, Peoples R China. 3.[2]Nanjing Univ, State Key Lab Novel Software Technol, Nanjing, Jiangsu, Peoples R China. 4.[3]Nanjing Univ, State Key Lab Novel Software Technol, Nanjing, Jiangsu, Peoples R China. 5.[4]Nanjing Univ, State Key Lab Novel Software Technol, Nanjing, Jiangsu, Peoples R China. 6.[5]Nanjing Univ, State Key Lab Novel Software Technol, Nanjing, Jiangsu, Peoples R China.
推荐引用方式 GB/T 7714	Liu, Jinping[1],Zhou, Yuming[2],Yang, Yibiao[3],et al. Code churn: A neglected metric in effort-aware just-in-time defect prediction[C]. 见:11TH ACM/IEEE INTERNATIONAL SYMPOSIUM ON EMPIRICAL SOFTWARE ENGINEERING AND MEASUREMENT (ESEM 2017). 2017-01-01.

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