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	Method of burn-in testing for thermally assisted head
	SHIMAZAWA, KOJI; TANAKA, KOSUKE; FUJII, RYUJI; HONDA, TAKASHI; NAGAI, YOSHITERU; NOMA, TSUGUKI; MITSUZAWA, HOSEI
	2013-08-13
著作权人	TDK CORPORATION
专利号	US8509036
国家	美国
文献子类	授权发明
其他题名	Method of burn-in testing for thermally assisted head
英文摘要	A plurality of laser diode units is tested in a bar state, each of the laser diode units in which a laser diode that includes a first electrode and a second electrode formed on surfaces facing each other and that is mounted on a mounting surface of a submount such that the first electrode faces the mounting surface of the submount. The method includes preparing a bar in which mounting areas each of which includes the laser diode unit formed thereon and dicing margins for separating the bar into the separate laser diode units are alternatively aligned along a longitudinal direction wherein a first pad electrically connected with the first electrode of the laser diode is disposed on the mounting surface of each of the mounting areas of the submounts and a second pad electrically connected to the first pad of either one of the mounting areas that are adjacent to the dicing margin is disposed on the mounting surface of each of the dicing margins of the submounts: contacting sheet-shaped probes to the second electrode and the second pad at a slantwise angle with respect to the second electrode and the second pad, and pressing the probes to the second electrode and the second pad while deforming the probes; and providing a potential difference between the second electrode and the second pad through the probes so that the laser diode emits laser light.
公开日期	2013-08-13
申请日期	2010-12-09
状态	授权
内容类型	专利
源URL	[http://ir.opt.ac.cn/handle/181661/34522]
专题	半导体激光器专利数据库
作者单位	TDK CORPORATION
推荐引用方式 GB/T 7714	SHIMAZAWA, KOJI,TANAKA, KOSUKE,FUJII, RYUJI,et al. Method of burn-in testing for thermally assisted head. US8509036. 2013-08-13.

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