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Device-associated infection rates, device use, length of stay, and mortality in intensive care units of 4 Chinese hospitals: International Nosocomial Control Consortium findings
Hu, Bijie; Tao, Lili; Rosenthal, Victor D.; Liu, Kun; Yun, Yang; Suo, Yao; Gao, Xiandong; Li, Ruisheng; Su, Danxia; Wang, Hungmei
刊名AMERICAN JOURNAL OF INFECTION CONTROL
2013
卷号41期号:4
关键词Central line-associated bloodstream infection Ventilator-associated pneumonia Catheter-associated urinary tract infection Developing countries Intensive care unit Mortality Length of stay
ISSN号0196-6553
URL标识查看原文
语种英语
内容类型期刊论文
URI标识http://www.corc.org.cn/handle/1471x/4899874
专题复旦大学上海医学院
推荐引用方式
GB/T 7714
Hu, Bijie,Tao, Lili,Rosenthal, Victor D.,et al. Device-associated infection rates, device use, length of stay, and mortality in intensive care units of 4 Chinese hospitals: International Nosocomial Control Consortium findings[J]. AMERICAN JOURNAL OF INFECTION CONTROL,2013,41(4).
APA Hu, Bijie.,Tao, Lili.,Rosenthal, Victor D..,Liu, Kun.,Yun, Yang.,...&Saunders, Catherine L..(2013).Device-associated infection rates, device use, length of stay, and mortality in intensive care units of 4 Chinese hospitals: International Nosocomial Control Consortium findings.AMERICAN JOURNAL OF INFECTION CONTROL,41(4).
MLA Hu, Bijie,et al."Device-associated infection rates, device use, length of stay, and mortality in intensive care units of 4 Chinese hospitals: International Nosocomial Control Consortium findings".AMERICAN JOURNAL OF INFECTION CONTROL 41.4(2013).
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