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	Short-Term Reliability Assessment for Islanded Microgrid Based on Time-Varying Probability Ordered Tree Screening Algorithm
	Guo, YC; Li, SH; Li, CB; Peng, HM
刊名	IEEE ACCESS
	2019
卷号	Vol.7页码:37324-37333
关键词	Analytic method islanded microgrid probabilistic sequence master-slave control strategy short-term reliability assessment time-varying probability ordered tree
ISSN号	2169-3536
URL标识	查看原文
公开日期	[db:dc_date_available]
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/4733655
专题	湖南大学
作者单位	1.Xiangtan Univ, Coll Informat Engn, Xiangtan 411105, Peoples R China 2.Hunan Univ, Coll Elect Engn & Informat, Changsha 410082, Hunan, Peoples R China
推荐引用方式 GB/T 7714	Guo, YC,Li, SH,Li, CB,et al. Short-Term Reliability Assessment for Islanded Microgrid Based on Time-Varying Probability Ordered Tree Screening Algorithm[J]. IEEE ACCESS,2019,Vol.7:37324-37333.
APA	Guo, YC,Li, SH,Li, CB,&Peng, HM.(2019).Short-Term Reliability Assessment for Islanded Microgrid Based on Time-Varying Probability Ordered Tree Screening Algorithm.IEEE ACCESS,Vol.7,37324-37333.
MLA	Guo, YC,et al."Short-Term Reliability Assessment for Islanded Microgrid Based on Time-Varying Probability Ordered Tree Screening Algorithm".IEEE ACCESS Vol.7(2019):37324-37333.

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