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	Atomic resolution analyses on defects in nanocrystalline Cu-based alloys generated by severe plastic deformation
	Yong Zhang; Zhen Xu; Wenquan Ming; Jinming Guo; Zaoli Zhang; Jianghua Chen
刊名	Materials Characterization
	2019
卷号	Vol.157页码:109886
关键词	Nanocrystalline Grain boundaries Dislocations TEM Geometric phase analysis
ISSN号	1044-5803
URL标识	查看原文
公开日期	[db:dc_date_available]
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/4614138
专题	湖南大学
作者单位	1.a Center for High-Resolution Electron Microscopy, College of Materials Science and Engineering, Hunan University, Changsha, Hunan 410082, China 2.Erich Schmid Institute of Materials Science, Austrian Academy of Sciences, Jahnstrae 12, A-8700 Leoben, Austria
推荐引用方式 GB/T 7714	Yong Zhang,Zhen Xu,Wenquan Ming,et al. Atomic resolution analyses on defects in nanocrystalline Cu-based alloys generated by severe plastic deformation[J]. Materials Characterization,2019,Vol.157:109886.
APA	Yong Zhang,Zhen Xu,Wenquan Ming,Jinming Guo,Zaoli Zhang,&Jianghua Chen.(2019).Atomic resolution analyses on defects in nanocrystalline Cu-based alloys generated by severe plastic deformation.Materials Characterization,Vol.157,109886.
MLA	Yong Zhang,et al."Atomic resolution analyses on defects in nanocrystalline Cu-based alloys generated by severe plastic deformation".Materials Characterization Vol.157(2019):109886.

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