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	Analytical Investigation of Cu(In, Ga)Se2 Thin Films Using Laser Induced Breakdown Spectroscopy Technology
	Xiu, Junshan; Liu, Shiming; Wang, Kunkun; Fu, Shenggui; Wang, Tao; Liu, Yunyan
刊名	Zhongguo Jiguang/Chinese Journal of Lasers
	2018
卷号	45期号:12
DOI	10.3788/CJL201845.1211002
URL标识	查看原文
公开日期	[db:dc_date_available]
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/4580220
专题	山东大学
作者单位	School of Physics and Optoelectronic Engineering, Shandong University of Techno
推荐引用方式 GB/T 7714	Xiu, Junshan,Liu, Shiming,Wang, Kunkun,et al. Analytical Investigation of Cu(In, Ga)Se2 Thin Films Using Laser Induced Breakdown Spectroscopy Technology[J]. Zhongguo Jiguang/Chinese Journal of Lasers,2018,45(12).
APA	Xiu, Junshan,Liu, Shiming,Wang, Kunkun,Fu, Shenggui,Wang, Tao,&Liu, Yunyan.(2018).Analytical Investigation of Cu(In, Ga)Se2 Thin Films Using Laser Induced Breakdown Spectroscopy Technology.Zhongguo Jiguang/Chinese Journal of Lasers,45(12).
MLA	Xiu, Junshan,et al."Analytical Investigation of Cu(In, Ga)Se2 Thin Films Using Laser Induced Breakdown Spectroscopy Technology".Zhongguo Jiguang/Chinese Journal of Lasers 45.12(2018).

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