Effect of annealing process on the surface roughness in multiple Al implanted4H-SiC
Wu, Hailei ; Sun, Guosheng ; Yang, Ting ; Yan, Guoguo ; Wang, Lei ; Zhao, Wanshun ; Liu, Xingfang ; Zeng, Yiping ; Wen, Jialiang
刊名journal of semiconductors
2011
卷号32期号:7页码:72002
关键词Aluminum Annealing Ion implantation Pressure effects Semiconducting silicon compounds Silicon carbide Surface roughness
ISSN号16744926
通讯作者wu, h.(hlwu@semi.ac.cn)
学科主题半导体材料
收录类别EI
语种英语
公开日期2012-06-14
内容类型期刊论文
源URL[http://ir.semi.ac.cn/handle/172111/23042]  
专题半导体研究所_半导体材料科学中心
推荐引用方式
GB/T 7714
Wu, Hailei,Sun, Guosheng,Yang, Ting,et al. Effect of annealing process on the surface roughness in multiple Al implanted4H-SiC[J]. journal of semiconductors,2011,32(7):72002.
APA Wu, Hailei.,Sun, Guosheng.,Yang, Ting.,Yan, Guoguo.,Wang, Lei.,...&Wen, Jialiang.(2011).Effect of annealing process on the surface roughness in multiple Al implanted4H-SiC.journal of semiconductors,32(7),72002.
MLA Wu, Hailei,et al."Effect of annealing process on the surface roughness in multiple Al implanted4H-SiC".journal of semiconductors 32.7(2011):72002.
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