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Defect evolution of oxygen induced Vth-shift for ON-state biased AlGaN/GaN HEMTs (Open Access)
Wang, Rong; Xu, Jianxing; Zhang, Shiyong; Cheng, Zhe; Zhang, Lian; Zheng, Penghui; Chen, Feng-Xiang; Tong, Xiaodong; Zhang, Yun; Tan, Wei
刊名Applied Physics Letters
2019
卷号115期号:14
ISSN号0003-6951
DOI10.1063/1.5112115
URL标识查看原文
收录类别EI
语种英语
内容类型期刊论文
URI标识http://www.corc.org.cn/handle/1471x/4241766
专题武汉大学
推荐引用方式
GB/T 7714
Wang, Rong,Xu, Jianxing,Zhang, Shiyong,et al. Defect evolution of oxygen induced Vth-shift for ON-state biased AlGaN/GaN HEMTs (Open Access)[J]. Applied Physics Letters,2019,115(14).
APA Wang, Rong.,Xu, Jianxing.,Zhang, Shiyong.,Cheng, Zhe.,Zhang, Lian.,...&Tan, Wei.(2019).Defect evolution of oxygen induced Vth-shift for ON-state biased AlGaN/GaN HEMTs (Open Access).Applied Physics Letters,115(14).
MLA Wang, Rong,et al."Defect evolution of oxygen induced Vth-shift for ON-state biased AlGaN/GaN HEMTs (Open Access)".Applied Physics Letters 115.14(2019).
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