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	Electrostatic field features on the shortest interelectrode path and a SVR model for breakdown voltage prediction of rod-plane air gaps
	Qiu, Zhibin; Ruan, Jiangjun; Xu, Wenjie; Wang, Xuezong; Huang, Daochun
刊名	IET SCIENCE MEASUREMENT & TECHNOLOGY
	2018
卷号	12期号:7
ISSN号	1751-8822
DOI	10.1049/iet-smt.2018.0058
URL标识	查看原文
收录类别	SCIE ; EI
语种	英语
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/4235536
专题	武汉大学
推荐引用方式 GB/T 7714	Qiu, Zhibin,Ruan, Jiangjun,Xu, Wenjie,et al. Electrostatic field features on the shortest interelectrode path and a SVR model for breakdown voltage prediction of rod-plane air gaps[J]. IET SCIENCE MEASUREMENT & TECHNOLOGY,2018,12(7).
APA	Qiu, Zhibin,Ruan, Jiangjun,Xu, Wenjie,Wang, Xuezong,&Huang, Daochun.(2018).Electrostatic field features on the shortest interelectrode path and a SVR model for breakdown voltage prediction of rod-plane air gaps.IET SCIENCE MEASUREMENT & TECHNOLOGY,12(7).
MLA	Qiu, Zhibin,et al."Electrostatic field features on the shortest interelectrode path and a SVR model for breakdown voltage prediction of rod-plane air gaps".IET SCIENCE MEASUREMENT & TECHNOLOGY 12.7(2018).

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