A Study on the Digital Nano-Moire Method and its Phase Shifting Technique | |
Xie HM; Liu ZW; Fang DN; Dai FL; Zhao YP(赵亚溥) | |
刊名 | Measurement Science & Technology |
2004 | |
通讯作者邮箱 | liuzw01@mails.tsinghua.edu.cn |
卷号 | 15期号:9页码:1716-1721 |
ISSN号 | 0957-0233 |
通讯作者 | Xie, HM (reprint author), Tsing Hua Univ, FML, Dept Mech Engn, Beijing 100084, Peoples R China. |
中文摘要 | A novel digital nano-moir´e method is proposed to measure the in-plane nanoscopic deformation of an object. In the measurement, the periodic lattice of a single-crystal material acts as a specimen grating while a digital reference grating (DRG) is prepared by computer software. These two gratings overlap to generate a moir´e fringe pattern. The preparation of the grating, the formation principle of digital nano-moir´e fringes and its relative phase shifting technique are described in detail. A typical experiment was conducted with a highly oriented pyrolytic graphite (HOPG) sample. The residual deformation of the irradiated HOPG sample was measured using this method. The experiment result verifies the feasibility of this method, and demonstrates the potential for further applications. |
学科主题 | 力学 |
类目[WOS] | Engineering, Multidisciplinary ; Instruments & Instrumentation |
研究领域[WOS] | Engineering ; Instruments & Instrumentation |
关键词[WOS] | ELECTRON MICROGRAPHS ; LOGICAL MOIRE ; PATTERNS |
收录类别 | SCI |
语种 | 英语 |
WOS记录号 | WOS:000223817700009 |
公开日期 | 2007-06-15 ; 2007-12-05 ; 2009-06-23 |
内容类型 | 期刊论文 |
源URL | [http://dspace.imech.ac.cn/handle/311007/15729] |
专题 | 力学研究所_力学所知识产出(1956-2008) |
推荐引用方式 GB/T 7714 | Xie HM,Liu ZW,Fang DN,et al. A Study on the Digital Nano-Moire Method and its Phase Shifting Technique[J]. Measurement Science & Technology,2004,15(9):1716-1721. |
APA | Xie HM,Liu ZW,Fang DN,Dai FL,&赵亚溥.(2004).A Study on the Digital Nano-Moire Method and its Phase Shifting Technique.Measurement Science & Technology,15(9),1716-1721. |
MLA | Xie HM,et al."A Study on the Digital Nano-Moire Method and its Phase Shifting Technique".Measurement Science & Technology 15.9(2004):1716-1721. |
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