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Generalized Completed Local Binary Patterns for Time-Efficient Steel Surface Defect Classification
Luo, Qiwu; Sun, Yichuang; Li, Pengcheng; Simpson, Oluyomi; Tian, Lu; He, Yigang
刊名IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT
2019
卷号68期号:3
关键词Automatic optical inspection (AOI) instrument hot-rolled strips image classification local binary patterns (LBP) surface defects
ISSN号0018-9456
DOI10.1109/TIM.2018.2852918
URL标识查看原文
收录类别SCIE
语种英语
内容类型期刊论文
URI标识http://www.corc.org.cn/handle/1471x/4215707
专题武汉大学
推荐引用方式
GB/T 7714
Luo, Qiwu,Sun, Yichuang,Li, Pengcheng,et al. Generalized Completed Local Binary Patterns for Time-Efficient Steel Surface Defect Classification[J]. IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT,2019,68(3).
APA Luo, Qiwu,Sun, Yichuang,Li, Pengcheng,Simpson, Oluyomi,Tian, Lu,&He, Yigang.(2019).Generalized Completed Local Binary Patterns for Time-Efficient Steel Surface Defect Classification.IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT,68(3).
MLA Luo, Qiwu,et al."Generalized Completed Local Binary Patterns for Time-Efficient Steel Surface Defect Classification".IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT 68.3(2019).
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