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	Use of polytetrafluoroethylene slurry for silica matrix removal in ETAAS direct determination of trace cobalt and nickel in silicon dioxide powder
	Wang, FY; Jiang, ZC; Peng, TY
刊名	JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY
	1999
卷号	14期号:6
ISSN号	0267-9477
DOI	10.1039/a900198k
URL标识	查看原文
收录类别	EI ; SCIE
语种	英语
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/4121394
专题	武汉大学
推荐引用方式 GB/T 7714	Wang, FY,Jiang, ZC,Peng, TY. Use of polytetrafluoroethylene slurry for silica matrix removal in ETAAS direct determination of trace cobalt and nickel in silicon dioxide powder[J]. JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY,1999,14(6).
APA	Wang, FY,Jiang, ZC,&Peng, TY.(1999).Use of polytetrafluoroethylene slurry for silica matrix removal in ETAAS direct determination of trace cobalt and nickel in silicon dioxide powder.JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY,14(6).
MLA	Wang, FY,et al."Use of polytetrafluoroethylene slurry for silica matrix removal in ETAAS direct determination of trace cobalt and nickel in silicon dioxide powder".JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY 14.6(1999).

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