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Reducing ripple error in depth-resolved wavenumber-scanning interferometry using scale-frequency transform
Lyu, Ziliang; Zhang, Yun; Bai, Yulei; Ye, Shuangli; Zhou, Yanzhou; He, Zhaoshui; Xie, Shengli
刊名OPTIK
2017
卷号138
关键词Wavenumber-scanning interferomery Ripple error Fourier transform Window function
ISSN号0030-4026
DOI10.1016/j.ijleo.2016.11.160
URL标识查看原文
收录类别SCIE ; EI
语种英语
内容类型期刊论文
URI标识http://www.corc.org.cn/handle/1471x/4088002
专题武汉大学
推荐引用方式
GB/T 7714
Lyu, Ziliang,Zhang, Yun,Bai, Yulei,et al. Reducing ripple error in depth-resolved wavenumber-scanning interferometry using scale-frequency transform[J]. OPTIK,2017,138.
APA Lyu, Ziliang.,Zhang, Yun.,Bai, Yulei.,Ye, Shuangli.,Zhou, Yanzhou.,...&Xie, Shengli.(2017).Reducing ripple error in depth-resolved wavenumber-scanning interferometry using scale-frequency transform.OPTIK,138.
MLA Lyu, Ziliang,et al."Reducing ripple error in depth-resolved wavenumber-scanning interferometry using scale-frequency transform".OPTIK 138(2017).
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