Reducing ripple error in depth-resolved wavenumber-scanning interferometry using scale-frequency transform | |
Lyu, Ziliang; Zhang, Yun; Bai, Yulei; Ye, Shuangli; Zhou, Yanzhou; He, Zhaoshui; Xie, Shengli | |
刊名 | OPTIK |
2017 | |
卷号 | 138 |
关键词 | Wavenumber-scanning interferomery Ripple error Fourier transform Window function |
ISSN号 | 0030-4026 |
DOI | 10.1016/j.ijleo.2016.11.160 |
URL标识 | 查看原文 |
收录类别 | SCIE ; EI |
语种 | 英语 |
内容类型 | 期刊论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/4088002 |
专题 | 武汉大学 |
推荐引用方式 GB/T 7714 | Lyu, Ziliang,Zhang, Yun,Bai, Yulei,et al. Reducing ripple error in depth-resolved wavenumber-scanning interferometry using scale-frequency transform[J]. OPTIK,2017,138. |
APA | Lyu, Ziliang.,Zhang, Yun.,Bai, Yulei.,Ye, Shuangli.,Zhou, Yanzhou.,...&Xie, Shengli.(2017).Reducing ripple error in depth-resolved wavenumber-scanning interferometry using scale-frequency transform.OPTIK,138. |
MLA | Lyu, Ziliang,et al."Reducing ripple error in depth-resolved wavenumber-scanning interferometry using scale-frequency transform".OPTIK 138(2017). |
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