Experimental and theoretical study of silicon-doped Sb2Te3 thin films: Structure and phase stability

	Experimental and theoretical study of silicon-doped Sb2Te3 thin films: Structure and phase stability
	Li,XL ; Rao,F ; Song,ZT ; Ren,K ; Liu,WL ; Sun,ZM
刊名	APPLIED SURFACE SCIENCE
	2011
卷号	257 期号:10 页码:4566-4568
关键词	ELSEVIER SCIENCE BV
ISSN号	0169-4332
学科主题	Chemistry ; Physical; Materials Science ; Coatings & Films; Physics ; Applied; Physics ; Condensed Matter
公开日期	2012-04-10
内容类型	期刊论文
源URL	[http://ir.sim.ac.cn/handle/331004/106769]
专题	上海微系统与信息技术研究所_功能材料与器件_期刊论文
推荐引用方式 GB/T 7714	Li,XL,Rao,F,Song,ZT,et al. Experimental and theoretical study of silicon-doped Sb2Te3 thin films: Structure and phase stability[J]. APPLIED SURFACE SCIENCE,2011,257(10):4566-4568.
APA	Li,XL,Rao,F,Song,ZT,Ren,K,Liu,WL,&Sun,ZM.(2011).Experimental and theoretical study of silicon-doped Sb2Te3 thin films: Structure and phase stability.APPLIED SURFACE SCIENCE,257(10),4566-4568.
MLA	Li,XL,et al."Experimental and theoretical study of silicon-doped Sb2Te3 thin films: Structure and phase stability".APPLIED SURFACE SCIENCE 257.10(2011):4566-4568.