The simulation of the thermal stress in GaN epilayer on silicon-based substrates
Sun, JY ; Chen, J ; Yang, ZF ; Ou, X ; Wang, X
刊名AD'07: Proceedings of Asia Display 2007, Vols 1 and 2
2007
页码1892-1894
关键词GROWTH MOCVD
通讯作者Sun, JY, Chinese Acad Sci, Shanghai Inst Microsyst & Informat Technol, State Key Lab Funct Mat Informat, Shanghai 200050, Peoples R China
学科主题Optics; Physics, Multidisciplinary; Physics, Condensed Matter
收录类别SCI
语种英语
公开日期2012-03-24
内容类型期刊论文
源URL[http://ir.sim.ac.cn/handle/331004/95111]  
专题上海微系统与信息技术研究所_功能材料与器件_期刊论文
推荐引用方式
GB/T 7714
Sun, JY,Chen, J,Yang, ZF,et al. The simulation of the thermal stress in GaN epilayer on silicon-based substrates[J]. AD'07: Proceedings of Asia Display 2007, Vols 1 and 2,2007:1892-1894.
APA Sun, JY,Chen, J,Yang, ZF,Ou, X,&Wang, X.(2007).The simulation of the thermal stress in GaN epilayer on silicon-based substrates.AD'07: Proceedings of Asia Display 2007, Vols 1 and 2,1892-1894.
MLA Sun, JY,et al."The simulation of the thermal stress in GaN epilayer on silicon-based substrates".AD'07: Proceedings of Asia Display 2007, Vols 1 and 2 (2007):1892-1894.
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