| Luminous Properties and Thermal Reliability of Screen-Printed Phosphor-in-Glass-Based White Light-Emitting Diodes | |
| Peng, Yang; Li, Ruixin; Wang, Simin; Chen, Zhen; Nie, Lei; Chen, Mingxiang* | |
| 刊名 | IEEE Transactions on Electron Devices
 |
| 2017 | |
| 卷号 | 64期号:3页码:1114-1119 |
| 关键词 | Luminous properties phosphor-in-glass (PiG) thermal reliability white light-emitting diodes (WLEDs) |
| ISSN号 | 0018-9383 |
| DOI | 10.1109/TED.2016.2645285 |
| URL标识 | 查看原文 |
| WOS记录号 | WOS:000396056700056;EI:20170403275300 |
| 内容类型 | 期刊论文 |
| URI标识 | http://www.corc.org.cn/handle/1471x/3374663 |
| 专题 | 武汉理工大学 |
| 作者单位 | 1.[Chen, Zhen 2.Chen, Mingxiang 3.Wang, Simin 4.Peng, Yang] Huazhong Univ Sci & Technol, Sch Mech Sci & Engn, Wuhan 430074, Peoples R China. |
| 推荐引用方式 GB/T 7714 | Peng, Yang,Li, Ruixin,Wang, Simin,et al. Luminous Properties and Thermal Reliability of Screen-Printed Phosphor-in-Glass-Based White Light-Emitting Diodes[J]. IEEE Transactions on Electron Devices,2017,64(3):1114-1119. |
| APA | Peng, Yang,Li, Ruixin,Wang, Simin,Chen, Zhen,Nie, Lei,&Chen, Mingxiang*.(2017).Luminous Properties and Thermal Reliability of Screen-Printed Phosphor-in-Glass-Based White Light-Emitting Diodes.IEEE Transactions on Electron Devices,64(3),1114-1119. |
| MLA | Peng, Yang,et al."Luminous Properties and Thermal Reliability of Screen-Printed Phosphor-in-Glass-Based White Light-Emitting Diodes".IEEE Transactions on Electron Devices 64.3(2017):1114-1119. |
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