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Cross-section design of multi-lumen extrusion dies: study on the effects of die swell and gas flow rate of the lumen
Jin, Guobao; Jin, Yifei; Zhao, Danyang; Dai, Guanghui; Zhang, Qingqing
刊名MICROSYSTEM TECHNOLOGIES-MICRO-AND NANOSYSTEMS-INFORMATION STORAGE AND PROCESSING SYSTEMS
2017
卷号23页码:5093-5104
ISSN号0946-7076
URL标识查看原文
WOS记录号[DB:DC_IDENTIFIER_WOSID]
内容类型期刊论文
URI标识http://www.corc.org.cn/handle/1471x/3313968
专题大连理工大学
作者单位1.Chaohu Coll, Sch Mech Engn, Hefei 238000, Anhui, Peoples R China.
2.Univ Florida, Mech & Aerosp Engn Dept, Gainesville, FL 32611 USA.
3.Dalian Univ Technol, Sch Mech Engn, Dalian 116024, Peoples R China.
推荐引用方式
GB/T 7714
Jin, Guobao,Jin, Yifei,Zhao, Danyang,et al. Cross-section design of multi-lumen extrusion dies: study on the effects of die swell and gas flow rate of the lumen[J]. MICROSYSTEM TECHNOLOGIES-MICRO-AND NANOSYSTEMS-INFORMATION STORAGE AND PROCESSING SYSTEMS,2017,23:5093-5104.
APA Jin, Guobao,Jin, Yifei,Zhao, Danyang,Dai, Guanghui,&Zhang, Qingqing.(2017).Cross-section design of multi-lumen extrusion dies: study on the effects of die swell and gas flow rate of the lumen.MICROSYSTEM TECHNOLOGIES-MICRO-AND NANOSYSTEMS-INFORMATION STORAGE AND PROCESSING SYSTEMS,23,5093-5104.
MLA Jin, Guobao,et al."Cross-section design of multi-lumen extrusion dies: study on the effects of die swell and gas flow rate of the lumen".MICROSYSTEM TECHNOLOGIES-MICRO-AND NANOSYSTEMS-INFORMATION STORAGE AND PROCESSING SYSTEMS 23(2017):5093-5104.
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