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Striations in electronegative capacitively coupled radio-frequency plasmas: analysis of the pattern formation and the effect of the driving frequency
Liu, Yong-Xin; Korolov, Ihor; Schuengel, Edmund; Wang, You-Nian; Donko, Zoltan; Schulze, Julian
刊名PLASMA SOURCES SCIENCE & TECHNOLOGY
2017
卷号26
关键词striations electronegative gas capacitively coupled rf plasma PROES PIC/MCC simulation ion-ion plasma model
ISSN号0963-0252
URL标识查看原文
WOS记录号[DB:DC_IDENTIFIER_WOSID]
内容类型期刊论文
URI标识http://www.corc.org.cn/handle/1471x/3283388
专题大连理工大学
作者单位1.Dalian Univ Technol, Sch Phys & Optoelectron Technol, Minist Educ, Key Lab Mat Modificat Laser Ion & Electron Beams, Dalian 116024, Peoples R China.
2.Univ Houston, Dept Chem & Biomol Engn, Plasma Proc Lab, Houston, TX 77204 USA.
3.Hungarian Acad Sci, Wigner Res Ctr Phys, Inst Solid State Phys & Opt, Konkoly Thege Miklos Str 29-33, H-1121 Budapest, Hungary.
4.West Virginia Univ, Dept Phys, Morgantown, WV 26506 USA.
5.Evatec AG, Hauptstr 1a, CH-9477 Truebbach, Switzerland.
6.Dalian Univ Technol, Sch Phys & Optoelectron Technol, Minist Educ, Key Lab Mat Modificat Laser Ion & Electron Beams, Dalian 116024, Peoples R China.
7.West Virginia Univ, Dept Phys, Morgantown, WV 26506 USA.
8.Ruhr Univ Bochum, Inst Elect Engn, D-44801 Bochum, Germany.
推荐引用方式
GB/T 7714
Liu, Yong-Xin,Korolov, Ihor,Schuengel, Edmund,et al. Striations in electronegative capacitively coupled radio-frequency plasmas: analysis of the pattern formation and the effect of the driving frequency[J]. PLASMA SOURCES SCIENCE & TECHNOLOGY,2017,26.
APA Liu, Yong-Xin,Korolov, Ihor,Schuengel, Edmund,Wang, You-Nian,Donko, Zoltan,&Schulze, Julian.(2017).Striations in electronegative capacitively coupled radio-frequency plasmas: analysis of the pattern formation and the effect of the driving frequency.PLASMA SOURCES SCIENCE & TECHNOLOGY,26.
MLA Liu, Yong-Xin,et al."Striations in electronegative capacitively coupled radio-frequency plasmas: analysis of the pattern formation and the effect of the driving frequency".PLASMA SOURCES SCIENCE & TECHNOLOGY 26(2017).
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