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	Method for online monitoring manufacturing overlapping rate of additive of laser e.g. semiconductor laser, involves position characteristic in unit to obtain overlapping value, where actual overlapping rate is obtained based on value.
	LIU W TANG Z YAN Z LIU X ZHANG N ZH
	2018
公开日期	2018-02-13
URL标识	查看原文
申请日期	2017-08-08
WOS记录号	[DB:DC_IDENTIFIER_WOSID]
内容类型	专利
URI标识	http://www.corc.org.cn/handle/1471x/3265297
专题	大连理工大学
作者单位	UNIV DALIAN TECHNOLOGY (UYDA-C
推荐引用方式 GB/T 7714	LIU W TANG Z YAN Z LIU X ZHANG N ZH. Method for online monitoring manufacturing overlapping rate of additive of laser e.g. semiconductor laser, involves position characteristic in unit to obtain overlapping value, where actual overlapping rate is obtained based on value.. 2018-01-01.

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