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	Follow Phenomenon of Breakdown Voltage in SF6 under Lightning Impulse
	You, Haoyang; Zhang, Qiaogen; Ma, Jingtan; Qin, Yifan; Wen, Tao; Guo, Can; Zhang, Yuxuan
刊名	IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION
	2016
卷号	23期号:[db:dc_citation_issue]页码:2677-2684
关键词	polarity up-and-down method standard lightning impulse Follow Phenomenon pressure time lag effective initial electrons
ISSN号	1070-9878
DOI	[db:dc_identifier_doi]
URL标识	查看原文
WOS记录号	[DB:DC_IDENTIFIER_WOSID]
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/3224587
专题	西安交通大学
推荐引用方式 GB/T 7714	You, Haoyang,Zhang, Qiaogen,Ma, Jingtan,et al. Follow Phenomenon of Breakdown Voltage in SF6 under Lightning Impulse[J]. IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION,2016,23([db:dc_citation_issue]):2677-2684.
APA	You, Haoyang.,Zhang, Qiaogen.,Ma, Jingtan.,Qin, Yifan.,Wen, Tao.,...&Zhang, Yuxuan.(2016).Follow Phenomenon of Breakdown Voltage in SF6 under Lightning Impulse.IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION,23([db:dc_citation_issue]),2677-2684.
MLA	You, Haoyang,et al."Follow Phenomenon of Breakdown Voltage in SF6 under Lightning Impulse".IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION 23.[db:dc_citation_issue](2016):2677-2684.

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