Doppler profile diagnostics on VUV spectra for the impurity ion temperature in edge plasmas of Large Helical Device | |
Oishi, T.; Morita, S.; Dai, S.Y.; Kobayashi, M.; Kawamura, G.; Liu, Y.; Goto, M. | |
2019 | |
会议名称 | 24th International Conference on Spectral Line Shapes, ICSLS 2018 |
会议日期 | 2018-06-17 |
会议地点 | Dublin, Ireland |
会议录 | 24th International Conference on Spectral Line Shapes, ICSLS 2018 |
URL标识 | 查看原文 |
WOS记录号 | [DB:DC_IDENTIFIER_WOSID] |
内容类型 | 会议论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/3224195 |
专题 | 大连理工大学 |
作者单位 | 1.National Institute for Fusion Science, National Institutes of Natural Sciences, 322-6, Oroshi-cho, Toki, Gifu, 509-5292, Japan |Department of Fusion Science, SOKENDAI , 322-6, Oroshi-cho, Toki, Gifu, 509-5292, Japan 2.Key Laboratory of Materials Modification by Laser, Ion and Electron Beams , School of Physics, Dalian University of Technology, Dalian, 116024, China 3.Department of Fusion Science, SOKENDAI , 322-6, Oroshi-cho, Toki, Gifu, 509-5292, Japan |
推荐引用方式 GB/T 7714 | Oishi, T.,Morita, S.,Dai, S.Y.,et al. Doppler profile diagnostics on VUV spectra for the impurity ion temperature in edge plasmas of Large Helical Device[C]. 见:24th International Conference on Spectral Line Shapes, ICSLS 2018. Dublin, Ireland. 2018-06-17. |
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